KATARI, M. New Computational Methods for Enhancing Reliability Testing of Interconnects in 3D ICs: Advanced Algorithms, Optimization Techniques, and Real-World Applications. Journal of Science & Technology, Ahmedabad, India, v. 5, n. 4, p. 52–94, 2024. DOI: 10.55662/JST.2024.5404. Disponível em: https://thesciencebrigade.com/jst/article/view/279. Acesso em: 19 sep. 2024.