Fabrication Process Integrity Monitoring and Insider Threat Detection: AI-Enhanced Cybersecurity for U.S. Semiconductor Manufacturing Infrastructure
Keywords:
fabrication process integrity monitoring, insider threat detection, ai-enhanced cybersecurity, u.s. semiconductor manufacturing infrastructure, machine learningAbstract
Sensors and built-in self-tests have become critical for successfully scaling beyond the 5-nanometer node. As such, U.S. semiconductor manufacturing is faced with vulnerable technology that offers adversaries opportunities to access sophisticated hidden backdoors. Enhanced cybersecurity solutions will aid our nation against cyberwars ranging from mere information collection to physical destruction of our power infrastructure.Downloads
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