Fabrication Process Integrity Monitoring and Insider Threat Detection: AI-Enhanced Cybersecurity for U.S. Semiconductor Manufacturing Infrastructure. Human-Computer Interaction Perspectives, Ahmedabad, India, v. 4, n. 2, p. 11–25, 2024. Disponível em: https://thesciencebrigade.com/hcip/article/view/801. Acesso em: 4 jun. 2026.